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Wyko Vision 32 Software: Frequently Asked Questions and Troubleshooting Tips



You may download one driver software related to the product you purchased to update your PCs driver software.) However, unauthorized use of this companys software for commercial purposes is prohibited.




Wyko Vision 32 Software



We now have two phase shifting interferometers. One is a Wyko/Veeco RTI (640480 res) with Vision 32 software. The other is a 4D AccuFiz (1.2K x 1.2K res) with 4Sight software. The AccuFiz has dynamic acquisition mode for greater instrument versatility.


Under Veeco, the surface profiling technology continued to excel, leading the surface metrology industry in patents and operation software. The Veeco Metrology Group specialized in creating top-end automated systems, as well as bringing the latest white light interferometry (WLI) features to table-top instruments. They developed the best-selling NT Series of optical profilers for quick and accurate 3D surface height measurements of precision surfaces, advanced materials and optics, biomaterials, MEMS and semiconductor packaging. Veeco Metrology Group also developed the SP series of fully automated non-contact surface metrology systems specifically for semiconductor manufacturers, and the HD series of interferometers for data storage manufacturers.


Fast and repeatable, the Wyko NT1100 provides high resolution 3D surface measurement, from sub-nanometer roughness to millimeter-high steps. The small-footprint NT1100 offers all the advantages of industry-standard Wyko optical profiling, including the full Vision 32 analytical software package. Advanced optics ensure sub-nanometer vertical resolution at all magnifications. The Data Stitching option adds a motorized stage for high resolution measurements over a larger field of view. The NT1100 enables accurate, cost-effective metrology for R&D and production of MEMS, thick films, optics, ceramics, and advanced materials.


Dektak 8 Advanced Development Profiler Manual Software Version 8.34 004-800-000 (standard) 004-800-100 (cleanroom) Copyright [2003, 2004] Veeco Instruments Inc. All rights reserved. Document Revision History: Dektak 8 Manual Revision Date Section(s) Affected Reference Approval G 12/29/04 All (SW V 8.34) N/A D. Page F 4/16/04 All. N/A D. Page E 1/23/04 Chapter 9, Sections 9.13, 9.14 N/A D. Page D 9/10/03 Chapter 4, p.81 N/A L. Burrows C 8/12/03 All. 477 C. Kowalski B 10/24/01 All. 445 C. Kowalski A 04/27/01 All. 402 J. Valencia


CoC bearings have shown the smallest wear volume both in vitro and in vivo studies [25,26,27,28]. In addition, ceramic materials present higher hardness and scratching resistance [18]; better lubrication properties as a result of their hydrophilic character [29]; and lower friction coefficient, resulting in smoother surface and improved quality. Furthermore, several studies demonstrated that CoC bearings significantly decreased the risks of osteolysis, aseptic loosening, and revision in comparison to MOP [30,31].


The roughness of the chipping species was determined by white light interferometry using a Wyko NT1100 Optical Interferometer (Veeco Instruments, USA) in vertical scanning interferometry mode with a vertical resolution of 2 nm. The analysis area was 112 90 µm. Data analysis was performed with Wyko Vision 32 software 4.20 update2 (Veeco Instruments, Plainview, New York, NY, USA), applying a Gaussian filter to separate waviness and form from roughness. The measurements were made in 3 different specimens of each type to characterize the amplitude parameter (Sa).


Fracture strengths were determined from different pieces of the balls fractured and from original balls. Five mechanical tests were realized in flexural method for each ball fractured. These tests were not in accordance with the standard because they involved fractured samples, however, the tests allowed us to view the trends of the mechanical behavior. The testing machine was a Bionix 858 MTS (Minneapolis, MN, USA) controlled by MTS Testworks 4 software.


The atomic number contrast backscattered electron images (BE) of the set and polished specimens (n = 3/product) were recorded to identify microstructural phase differences. The images were taken with a scanning electron microscope (SEM Quanta 200, FEI, Hilsboro, OR, USA) under the following conditions: Low vacuum mode (0.13 MPa chamber pressure), 20 kV accelerating voltage, 90 μA beam current and 500 magnification. Different mean atomic number phases were determined based on the gray-level discrimination and quantified by means of image analysis employing a dedicated software (XT Docu v3.2; Soft Imaging System GmbH, Münster, Germany). Each phase was quantified as the percentage coverage of the total specimen surface area imaged.


After digitizing the radiographs at 1.000 dpi in grayscale mode with a scanner (UMAX Powerlook III, Willich, Germany), a digital subtraction analysis was conducted according to Eberhard et al12 using the software Photoshop 7.0 (Adobe, San Jose, Calif) and NIH Image 1.34 (National Institutes of Health, Bethesda, Md).


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The selection of the workpiece is based on the following terms: high production rate, an extremely hard material, tighter The average surface roughness (Ra) and maximum surface roughness (Rt) values before and after ECH, is measured by a Wyko NT 1100 optical profilometer interfaced with Vision32 software. Ten separate measurements on the work surface and the average value is used. The percentage improvement in the average surface roughness (PIRa) and maximum surface roughness (PIRt) is calculated by using Eqs. 1 and 2 respectively. Higher values of PIRa and PIRt indicate the smaller value of final Ra and Rt respectively. The out-of-roundness vales before and after ECH is measured using dial gauge. The percentage improvement in out-of-roundness (PIOR) is calculated using Eq. 3.


Substrates from small chips to 150mm wafers. A wide range of beam currents, choice of two objective lenses, and a wide range of resist processes provide significant flexibility for a variety of needs. Sophisticated data preparation software provides advanced functions including full shape and dose proximity correction.


The present study emphases the effect of finishing time onprecision finishing of spur gears by PECH process and thus it helps torealize the different aspects of the process. For the present study, PECHexperimental setup incorporating several unique features to exercise aprecise control over the operational kinematics and process input parameterswith a good parameter range was designed and developed indigenously as shownin Fig. 1. It consists of five major subsystems namely pulse power supplysystem, electrolyte supply system, tooling system, tool motion system, andmachining chamber. Pulse power supply system consists of a constant voltage(0-110 V) and pulse-setting DC (up to 100 A) supplying units. Electrolytesupply system consists of electrolyte storage and settling tanks, pump, heatexchanger, flow meter, flow valves. The tooling system contains three typesof gears: cathode gear, workpiece gear and honing gear. For the purpose, aspecial type of cathode gear has been designed having the capability ofvarying the rate of electrolytic dissolution steplessly along the fullprofile of the workpiece gear. All gears are mounted on special type of axlesmade of stainless steel. Brackets are used for holding the gear axles ofcathode and honing gears. The tool-motion system comprises of a DC inductionmotor to provide rotary motion to the workpiece gear and a programmablestepper motor to provide reciprocating motion. The entire tooling system withaxles and brackets are enclosed in a machining chamber made of perspex forbetter visibility and corrosion-resistance. In the present work, finishingtime is used as input process parameter to investigate its effect onfinishing of gear tooth profile by analysing the surface roughness valuesbefore and after the process. The surface roughness values before and afterECH, is measured by a Wyko NT 1100 optical profilometer interfaced withVision[R]32 software. Ten separate measurements each at tip, middle and rootof one particular gear tooth are taken along the face-width of the gear andthe average value is used. Percentage improvement in average/maximum surfaceroughness value (PIRa / PIRtm) is defined as follows: 2ff7e9595c


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